Division of Microelectronic Systems Design (EMS)

Kira Kraft, M.Sc.


Address

Erwin-Schrödinger-Straße
Building 12, Room 224
67663 Kaiserslautern

Contact

Phone: (+49) 631 / 205-3638
Fax: (+49) 631 / 205-4437
Email: kraft(at)eit.uni-kl.de

Research areas

  • Forward Error Correction Codes
  • Maximum Likelihood Decoding
  • Error Correction for DRAMs

Courses

  • Synthesis and Optimization of Microelectronic Systems I

Publications

Fast Validation of DRAM Protocols with Timed Petri Nets
M. Jung, K. Kraft, T. Soliman, C. Sudarshan, C. Weis, N. Wehn. ACM International Symposium on Memory Systems (MEMSYS 2019), October, 2019, Washington, DC, USA.
Best Paper Award

A Low-Complexity Projection Algorithm for ADMM-Based LP Decoding
F. Gensheimer, T. Dietz, S. Ruzika, K. Kraft, N. Wehn. International Symposium on Turbo Codes & Iterative Information Processing (ISTC), December, 2018, Hong Kong, China.

Efficient Coding Scheme for DDR4 Memory Subsystems
K. Kraft, D. M. Mathew, C. Sudarshan, M. Jung, C. Weis, N. Wehn, F. Longnos. ACM International Symposium on Memory Systems (MEMSYS 2018), October, 2018, Washington, DC, USA.
Best Paper Award

Improved Maximum-Likelihood Decoding Using Sparse Parity-Check Matrices
F. Gensheimer, T. Dietz, S. Ruzika, K. Kraft, N. Wehn. International Conference on Telecommunications, June, 2018, Saint Malo, France.

Improved Channel Coding with Manipulated Matrices
K. Kraft, T. Dietz. Young Researchers Symposium, June, 2018, Kaiserslautern, Germany.
3. Best Talk Award

Improving the Error Behavior of DRAM by Exploiting its Z-Channel Property
K. Kraft, M. Jung, C. Sudarshan, D. M. Mathew, C. Weis, N. Wehn. IEEE Conference Design, Automation and Test in Europe (DATE), March, 2018, Dresden, Germany.

Using Run-Time Reverse-Engineering to Optimize DRAM Refresh
D. M. Mathew, É. F. Zulian, M. Jung, K. Kraft, C. Weis, B. Jacob, N. Wehn. International Symposium on Memory Systems (MEMSYS 2017), October, 2017, Washington, DC, USA.

Bit-level Pipelining for Highly Parallel Turbo-Code Decoders: A Critical Assessment
S. Weithoffer, K. Kraft, N. Wehn. IEEE AFRICON, September, 2017, Cape Town, South Africa.

A New State Model for DRAMs Using Petri Nets
M. Jung, K. Kraft, N. Wehn. IEEE International Conference on Embedded Computer Systems Architectures Modeling and Simulation (SAMOS), July, 2017, Samos Island, Greece.

Zum Seitenanfang